T. H. Hsu

Publications (4)

• Optimization of programming current on endurance of phase change memory (2012). Proceedings of Technical Program of 2012 VLSI Technology, System and Application (VLSI-TSA), April, 2012
• The impact of melting during reset operation on the reliability of phase change memory (2012). 2012 IEEE International Reliability Physics Symposium (IRPS), April, 2012
• A low power phase change memory using thermally confined TaN/TiN bottom electrode (2011). 2011 International Electron Devices Meeting (IEDM), Dec, 2011
• Explore physical origins of resistance drift in phase change memory and its implication for drift-insensitive materials (2011). 2011 International Electron Devices Meeting (IEDM), Dec, 2011