S. C. Lai

Publications (2)

• Optimization of programming current on endurance of phase change memory (2012). Proceedings of Technical Program of 2012 VLSI Technology, System and Application (VLSI-TSA), April, 2012
• The impact of melting during reset operation on the reliability of phase change memory (2012). 2012 IEEE International Reliability Physics Symposium (IRPS), April, 2012