Xiao Zhang

Publications (2)

• Theory and Experiments of the Impact of Work-Function Variability on Threshold Voltage Variability in MOS Devices (2012). IEEE Transactions on Electron Devices, 59, (11), 3124–3126
• Physical model of the impact of metal grain work function variability on emerging dual metal gate MOSFETs and its implication for SRAM reliability (2009). 2009 IEEE International Electron Devices Meeting (IEDM), Dec, 2009