A generic and reconfigurable test paradigm using Low-cost integrated Poly-Si TFTs

Jing Li, S. Ghosh, Kaushik Roy
DOI
Type
Conference paper
Publication
2007 IEEE International Test Conference (ITC), Oct, 2007
conference vlsi built-in self test design for testability elemental semiconductors integrated circuit testing silicon thin film transistors 3-d technology bist components si vlsi systems configurable design-for-test units generic test structure low-cost low-temperature integrated poly-silicon tft process tolerant test structure reconfigurable test structure thin film transistors circuit testing costs crystallization design for testability silicon substrates system testing temperature thin film transistors very large scale integration
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Jing Li
Eduardo D. Glandt Faculty Fellow and Associate Professor, Co-director for CyberSavvy Center

Attracted to all the big problems in computer system across the stack regardless the specific sub-areas.