Modeling of Failure Probability and Statistical Design of Spin-Torque Transfer Magnetic RAM (STT MRAM) Array for Yield Enhancement
Type
Publication
SRC Technology and Talent for the 21st Century Technology (TECHCON), 2008
Jing Li
Eduardo D. Glandt Faculty Fellow and Associate Professor, Co-director for CyberSavvy Center
Attracted to all the big problems in computer system across the stack regardless the specific sub-areas.