Modeling of failure probability and statistical design of Spin-Torque Transfer Magnetic Random Access Memory (STT MRAM) array for yield enhancement

Jing Li, Charles Augustine, Sayeef Salahuddin, Kaushik Roy
DOI
Type
Conference paper
Publication
2008 45th ACM/IEEE Design Automation Conference (DAC), June, 2008

(Acceptance Rate: underline23%, 147 out of 639)

conference failure analysis magnetic storage magnetoelectronics optimisation random-access storage coupled electromagnetic dynamics failure probability on-chip embedded memories spin-torque transfer magnetic random access memory spintronic device statistical optimization methodology yield enhancement couplings failure analysis flash memory magnetic analysis magnetic devices predictive models probability random access memory read-write memory scalability stt mram yield
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Jing Li
Eduardo D. Glandt Faculty Fellow and Associate Professor

Attracted to all the big problems in computer system across the stack regardless the specific sub-areas.