Modeling of failure probability and statistical design of Spin-Torque Transfer Magnetic Random Access Memory (STT MRAM) array for yield enhancement

2008 45th ACM/IEEE Design Automation Conference (DAC), June, 2008

(Acceptance Rate: underline23%, 147 out of 639)

Jing Li
Eduardo D. Glandt Faculty Fellow and Associate Professor

Attracted to all the big problems in computer system across the stack regardless the specific sub-areas.